Verisurf Software has introduced Verisurf 2017, the latest release of its measurement software for analysis, quality inspection, assembly guidance and reverse engineering. With this release, Verisurf also punctuates its ongoing commitment to improved scan data management with a spectrum of new tools for managing, displaying, editing, and enhancing scan and mesh data.
The main highlights of this release are:
User Interface: A completely reorganized user interface features all new icons, expanded, pop-up “tool tips,” and improved dialogs consistent with current Windows standards and in a manner that streamlines common metrology workflows and makes Verisurf easier to learn.
Software Development Kit (SDK): Verisurf 2017 includes a SDK that allows programmers to create custom external applications in any common programming language with programmatic access to Verisurf features and functions. Apps can run locally, over intranets or the public internet with Verisurf running minimized or as a background process.
Scan Data Management Enhancements: Verisurf 2017 includes new, granular settings for the collection and display of scan data, including: Max scan rate, Max scan inspect rate, and Max scan angle. Users can assign color based on the angle between the scanner and the part to assess scan data quality and filter out scan data in areas where point clouds overlap.
“At Verisurf our goal is to provide a comprehensive set of measurement tools so Quality and Manufacturing Engineers can effectively do their jobs. This includes an ongoing commitment to open standards and interoperability for more seamless workflow and the ability to maintain a digital thread between design, manufacturing, and quality inspection,” said Ernie Husted, president of Verisurf Software Inc. “As always, Verisurf users continue to provide practical insight necessary to help guide our software development.”
For more information, visit Verisurf.
Sources: Press materials received from the company and additional information gleaned from the company’s website.