Remcom Releases 5G Antenna Array Design Features in XFdtd Electromagnetic Simulation Software 

Remcom announces 5G antenna array design features in the latest release of XFdtd 3D EM Simulation Software, including workflow enhancements for modeling complex devices at millimeter wave frequencies.

XFdtd provides performance metrics for 5G beam steering applications by simulating the radiation pattern for different array or subarray phasing conditions that are used to steer a beam. By considering the optimal gain levels of the various beam steering scenarios, XFdtd plots the cumulative distribution function (CDF) of the effective isotropic radiated power (EIRP) of the array as a whole. The EIRP is an indicator of the array’s quality of coverage and is particularly valuable for analyzing 5G-capable devices that support multi-user MIMO (MU-MIMO) use cases.

“The CDF of EIRP metric is growing in importance as carriers require devices to meet strict quality thresholds,” says Rodney Korte, product manager for XFdtd. “Our customers designing mobile devices need to measure the gain of many signals propagating in different directions, and Remcom is at the forefront of this emerging technology. The new CDF of EIRP plot is a way to help design engineers prepare their devices for the challenging demands of 5G networks.”

The matching network design workflow has also been enhanced via XFdtd’s integration with Optenni Lab matching circuit optimization software. Optenni's optimized matching topology data can now be imported directly into XFdtd, providing users with immediate feedback on how the circuit will behave and eliminating the need to run another simulation. Results such as S-parameters, efficiency, and dissipated power are readily available for analysis of system performance, greatly simplifying the matching process for intricate devices with many frequency bands.

The release also introduces modeling options that improve simulation accuracy for the higher frequencies typical of the antennas in modern devices, including a new feed specifically designed for exciting microstrips, surface current measurement, and a user-defined input for surface roughness of conductors.

Sources: Press materials received from the company.

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